RF430CL331HIPWR datasheet(52/60 Pages) TI1

52 / 60 page

RF430CL331H

SLASE18A – SEPTEMBER 2015 – REVISED NOVEMBER 2015

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7.5

Electrostatic Discharge Caution

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

7.6

Export Control Notice

Recipient agrees to not knowingly export or re-export, directly or indirectly, any product or technical data

(as defined by the U.S., EU, and other Export Administration Regulations) including software, or any

controlled product restricted by other applicable national regulations, received from disclosing party under

nondisclosure obligations (if any), or any direct product of such technology, to any destination to which

such export or re-export is restricted or prohibited by U.S. or other applicable laws, without obtaining prior

authorization from U.S. Department of Commerce and other competent Government authorities to the

extent required by those laws.

7.7

Glossary

SLYZ022 — TI Glossary.

This glossary lists and explains terms, acronyms and definitions.

Mechanical, Packaging, and Orderable Information

The following pages include mechanical, packaging, and orderable information. This information is the

most current data available for the designated devices. This data is subject to change without notice and

revision of this document. For browser-based versions of this data sheet, refer to the left-hand navigation.

Mechanical, Packaging, and Orderable Information

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RF430CL331HIPWR 데이터시트(PDF) 52 Page - Texas Instruments