LP8501

www.ti.com

SNVS548D – SEPTEMBER 2008 – REVISED AUGUST 2013

Pin

Name

Type

Description

A1

D1

A

Current source output 1

A2

D2

A

Current source output 2

A3

VOUT

A

Charge pump output

A4

C2-

A

Flying capacitor 2 negative terminal

A5

C2+

A

Flying capacitor 2 positive terminal

B1

D3

A

Current source output 3

B2

D4

A

Current source output 4

B3

VDD1_6

P

Power for D1 to D6 drivers

B4

C1-

A

Flying capacitor 1 negative terminal

B5

C1+

A

Flying capacitor 1 positive terminal

C1

D5

A

Current source output 5

C2

D6

A

Current source output 6

C3

VDD7_9

P

Power for D7 to D9 drivers

C4

EN

I

Enable

C5

VDD

P

Input power supply

D1

D7

A

Current source output 7.

D2

D8

A

Current source output 8.

D3

INT

OD/O

Interrupt for microcontroller unit. Leave unconnected if not used

D4

CLK

I

32 kHz clock input; connect to ground if not used.

D5

GND

G

Ground

E1

D9

A

Current source output 9.

E2

GPO

O

General purpose output. Leave unconnected if not used.

E3

TRIG

I/OD

Trigger; connect to ground if not used.

E4

SDA

I/OD

Serial interface data

E5

SCL

I

Serial interface clock

(1)

A: Analog Pin, G: Ground Pin, P: Power Pin, I: Input Pin, I/O Input/Output Pin, O: Output Pin, OD: Open Drain Pin

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

Copyright © 2008–2013, Texas Instruments Incorporated

Submit Documentation Feedback

5

Product Folder Links: LP8501