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STM32F058C8 데이터시트(PDF) 72 Page - STMicroelectronics

부품명 STM32F058C8
상세설명  Advanced ARM-based 32-bit MCU, 64 KB Flash, 11 timers, ADC, DAC & comm. interfaces, 1.8 V
PDF  104 Pages
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제조업체  STMICROELECTRONICS [STMicroelectronics]
홈페이지  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

STM32F058C8 데이터시트(HTML) 72 Page - STMicroelectronics

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Electrical characteristics
STM32F058C8 STM32F058R8 STM32F058T8
72/104
DocID023402 Rev 3
28.52.0425.2
41.52.9637.2
55.5
3.96
50
71.5
5.11
NA
239.5
17.1
NA
1. Guaranteed by design, not tested in production.
Table 51. RAIN max for fADC = 14 MHz (continued)
Ts (cycles)
tS (µs)
RAIN max (kΩ)(1)
Table 52. ADC accuracy(1)(2)(3)
Symbol
Parameter
Test conditions
Typ
Max(4)
Unit
ET
Total unadjusted error
fPCLK = 48 MHz,
fADC = 14 MHz, RAIN < 10 kΩ
VDDA = 3 V to 3.6 V
TA = 25 °C
±1.3
±2
LSB
EO
Offset error
±1
±1.5
EG
Gain error
±0.5
±1.5
ED
Differential linearity error
±0.7
±1
EL
Integral linearity error
±0.8
±1.5
ET
Total unadjusted error
fPCLK = 48 MHz,
fADC = 14 MHz, RAIN < 10 kΩ
VDDA = 2.7 V to 3.6 V
TA =
−40 to 105 °C
±3.3
±4
LSB
EO
Offset error
±1.9
±2.8
EG
Gain error
±2.8
±3
ED
Differential linearity error
±0.7
±1.3
EL
Integral linearity error
±1.2
±1.7
ET
Total unadjusted error
fPCLK = 48 MHz,
fADC = 14 MHz, RAIN < 10 kΩ
VDDA = 2.4 V to 3.6 V
TA = 25 °C
±3.3
±4
LSB
EO
Offset error
±1.9
±2.8
EG
Gain error
±2.8
±3
ED
Differential linearity error
±0.7
±1.3
EL
Integral linearity error
±1.2
±1.7
1. ADC DC accuracy values are measured after internal calibration.
2. ADC Accuracy vs. Negative Injection Current: Injecting negative current on any of the standard (non-robust) analog input
pins should be avoided as this significantly reduces the accuracy of the conversion being performed on another analog
input. It is recommended to add a Schottky diode (pin to ground) to standard analog pins which may potentially inject
negative current.
Any positive injection current within the limits specified for IINJ(PIN) and ΣIINJ(PIN) in Section 6.3.13 does not affect the ADC
accuracy.
3. Better performance may be achieved in restricted VDDA, frequency and temperature ranges.
4. Data based on characterization results, not tested in production.



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