STM32F722IC datasheet(113/229 Pages) STMICROELECTRONICS

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DS11853 Rev 6

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STM32F722xx STM32F723xx

Electrical characteristics

201

Typical and maximum current consumption

The MCU is placed under the following conditions:

•

All I/O pins are in input mode with a static value at VDD or VSS (no load).

•

All peripherals are disabled except if it is explicitly mentioned.

•

The Flash memory access time is adjusted both to fHCLK frequency and VDD range

(see Table 17: Limitations depending on the operating power supply range).

•

When the regulator is ON, the voltage scaling and over-drive mode are adjusted to

fHCLK frequency as follows:

–

Scale 3 for fHCLK ≤ 144 MHz

–

Scale 2 for 144 MHz < fHCLK ≤ 168 MHz

–

Scale 1 for 168 MHz < fHCLK ≤ 216 MHz. The over-drive is only ON at 216 MHz.

•

When the regulator is OFF, the V12 is provided externally as described in Table 16:

General operating conditions:

•

The system clock is HCLK, fPCLK1 = fHCLK/4, and fPCLK2 = fHCLK/2.

•

External clock frequency is 25 MHz and PLL is ON when fHCLK is higher than 25 MHz.

•

The typical current consumption values are obtained for 1.7 V

≤ VDD ≤ 3.6 V voltage

range and for TA= 25 °C unless otherwise specified.

•

The maximum values are obtained for 1.7 V

≤ VDD ≤ 3.6 V voltage range and a

maximum ambient temperature (TA) unless otherwise specified.

•

For the voltage range 1.7 V

≤ VDD ≤ 3.6 V, the maximum frequency is 180 MHz.

Table 24. Typical and maximum current consumption in Run mode, code with data processing

running from ITCM RAM, regulator ON

Symbol

Parameter

Conditions

fHCLK (MHz)

Typ

Max(1)

Unit

TA = 25 °C TA = 85 °C TA = 105 °C

IDD

Supply cur-

rent in RUN

mode

All peripherals

enabled(2)(3)

216

156

170(4)

180(4)

200

144

154

164.6

183

180

127

134(4)

143(4)

158(4)

168

113

119

127.4

141

144

112.6

126

52.8

33.5

All peripherals

disabled(3)

216

110(4)

119.6(4)

138.5

200

102

113.1

132

180

90(4)

96.7(4)

125(4)

168

86.5

100.1

144

77.1

90.8

38.5

50.3

26.3

38.1

1. Guaranteed by characterization results.

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