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IMX7SCEC 데이터시트(PDF) 21 Page - NXP Semiconductors |
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IMX7SCEC 데이터시트(HTML) 21 Page - NXP Semiconductors |
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21 / 155 page ![]() Electrical characteristics i.MX 7Solo Family of Applications Processors Datasheet, Rev. 7, 09/2023 NXP Semiconductors 21 4.1.2 Thermal resistance 4.1.2.1 FPBGA case “X” and case “Y” package thermal resistance Table 8 displays the thermal resistance data. Per JEDEC JESD51-2, the intent of thermal resistance measurements is solely for a thermal performance comparison of one package to another in a standardized environment. This methodology is not meant to and does not predict the performance of a package in an application-specific environment. 4.1.3 Operating ranges Table 9 provides the operating ranges of the i.MX 7Solo family of processors. For details on the chip's power structure, see the “Power Management Unit (PMU)” chapter of the i.MX 7Solo Application Processor Reference Manual (IMX7SRM). 1 OVDD is the I/O supply voltage. Table 8. Thermal Resistance Data Rating Test conditions Symbol 12x12 pkg value 19x19 pkg value Unit Junction to Ambient1 1 Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting site (board) temperature, ambient temperature, air flow, power dissipation of other components on the board, and board thermal resistance. Single-layer board (1s); natural convection2 Four-layer board (2s2p); natural convection2 2 Per JEDEC JESD51-2 with the single layer board horizontal. Thermal test board meets JEDEC specification for the specified package. RJA RJA 55.4 32.6 44.4 30.2 oC/W oC/W Junction to Ambient1 Single-layer board (1s); airflow 200 ft/min2,3 Four-layer board (2s2p); airflow 200 ft/min2,3 3 Per JEDEC JESD51-6 with the board horizontal. RJA RJA 41.8 28.0 34.3 25.8 oC/W oC/W Junction to Board1,4 4 Thermal resistance between the die and the printed circuit board per JEDEC JESD51-8. Board temperature is measured on the top surface of the board near the package. — RJB 16.0 17.4 oC/W Junction to Case1,5 5 Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883 Method 1012.1). — RJC 10.5 10.4 oC/W Junction to Package Top1,6 6 Thermal characterization parameter indicating the temperature difference between package top and the junction temperature per JEDEC JESD51-2. When Greek letters are not available, the thermal characterization parameter is written as Psi-JT. Natural Convection JT 0.2 0.2 oC/W Junction to Package Bottom Natural Convection RB_CSB 15.3 17.3 oC/W |
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