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SCANSTA101SM/NOPB 데이터시트(PDF) 2 Page - Texas Instruments

부품명 SCANSTA101SM/NOPB
상세설명  SCANSTA101 Low Voltage IEEE 1149.1 System Test Access (STA) Master
PDF  42 Pages
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제조업체  TI2 [Texas Instruments]
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SCANSTA101SM/NOPB 데이터시트(HTML) 2 Page - Texas Instruments

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SCANSTA101
SNLS057J – MAY 2002 – REVISED APRIL 2013
www.ti.com
SCANSTA101 ARCHITECTURE
Figure 1. SCANSTA101 STA Master and Interfaces
Figure 1 shows a high level view of the SCANSTA101 STA Master and its interfaces. Table 1 provides a brief
description of each of these interfaces. provides a brief description of the device pins and their functions. The
device is composed of three interfaces around a dual-port memory. These interfaces are the Parallel Processor
Interface (PPI), Serial Scan Interface (SSI), and Test and Debug Interface. The System Input block designates
inputs that have global use across the device.
The Test and Debug Interface supports BIST, boundary scan, and internal scan for the SCANSTA101.
Table 1. INTERFACE DESCRIPTIONS
Interface
Description
Parallel Processor Interface
Used for configuration, ScanMaster scan chain loads and reads, programmable device file loads
and reads, and status monitoring.
Serial Scan Interface
Performs parallel to serial conversion, sequences and formats the outgoing serial stream to
conform to 1149.1 protocol.
Test and Debug Interface
IEEE 1149.1 TAP
System Inputs
Interface inputs for system control, i.e. clock, reset and output tristate control.
2
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