PESDXV4UF_G_W_3

© NXP B.V. 2008. All rights reserved.

Product data sheet

Rev. 03 — 28 January 2008

8 of 16

NXP Semiconductors

PESDxV4UF/G/W

Very low capacitance quadruple ESD protection diode arrays

Fig 8.

ESD clamping test setup and waveforms

006aab125

50

Ω

vertical scale = 200 V/div

horizontal scale = 50 ns/div

unclamped +1 kV ESD voltage waveform

(IEC 61000-4-2 network)

clamped +1 kV ESD voltage waveform

(IEC 61000-4-2 network)

unclamped

−1 kV ESD voltage waveform

(IEC 61000-4-2 network)

clamped

−1 kV ESD voltage waveform

(IEC 61000-4-2 network)

vertical scale = 200 V/div

horizontal scale = 50 ns/div

vertical scale = 5 V/div

horizontal scale = 50 ns/div

GND

GND

GND

GND

GND

450

Ω

RG 223/U

50

Ω coax

ESD TESTER

IEC 61000-4-2 network

4 GHz DIGITAL

OSCILLOSCOPE

10

×

ATTENUATOR

DUT

Device

Under

Test

vertical scale = 5 V/div

horizontal scale = 50 ns/div

PESD3V3V4UF/G/W

PESD5V0V4UF/G/W