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STM32F051K6 데이터시트(PDF) 44 Page - STMicroelectronics |
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STM32F051K6 데이터시트(HTML) 44 Page - STMicroelectronics |
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44 / 104 page ![]() STM32F051x Electrical characteristics Doc ID 022265 Rev 3 45/105 6.3.4 Embedded reference voltage The parameters given in Table 24 are derived from tests performed under ambient temperature and VDD supply voltage conditions summarized in Table 20. 6.3.5 Supply current characteristics The current consumption is a function of several parameters and factors such as the operating voltage, ambient temperature, I/O pin loading, device software configuration, operating frequencies, I/O pin switching rate, program location in memory and executed binary code. The current consumption is measured as described in Figure 11: Current consumption measurement scheme. All Run-mode current consumption measurements given in this section are performed with a reduced code that gives a consumption equivalent to CoreMark code. VPVD5 PVD threshold 5 Rising edge 2.57 2.68 2.79 V Falling edge 2.47 2.58 2.69 V VPVD6 PVD threshold 6 Rising edge 2.66 2.78 2.9 V Falling edge 2.56 2.68 2.8 V VPVD7 PVD threshold 7 Rising edge 2.76 2.88 3 V Falling edge 2.66 2.78 2.9 V VPVDhyst (2) PVD hysteresis - 100 - mV IDD(PVD) PVD current consumption - 0.15 0.26 µA 1. Data based on characterization results only, not tested in production. 2. Guaranteed by design, not tested in production. Table 23. Programmable voltage detector characteristics (continued) Symbol Parameter Conditions Min(1) Typ Max(1) Unit Table 24. Embedded internal reference voltage Symbol Parameter Conditions Min Typ Max Unit VREFINT Internal reference voltage –40 °C < TA < +105 °C 1.16 1.2 1.25 V –40 °C < TA < +85 °C 1.16 1.2 1.24(1) 1. Data based on characterization results, not tested in production. V TS_vrefint (2) 2. Shortest sampling time can be determined in the application by multiple iterations. ADC sampling time when reading the internal reference voltage -5.1 17.1(3) 3. Guaranteed by design, not tested in production. µs VRERINT Internal reference voltage spread over the temperature range VDD = 3 V ±10 mV - - 10(3) mV TCoeff Temperature coefficient - - 100(3) ppm/°C |
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