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전자부품 데이터시트 검색엔진 |
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전자부품 데이터시트 검색엔진 |
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VX6854LC 데이터시트(PDF) 106 Page - STMicroelectronics |
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VX6854LC 데이터시트(HTML) 106 Page - STMicroelectronics |
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106 / 114 page  Defect categorization VX6854LC 106/114 DocID027110 Rev 2 An average value is calculated for both the “small” and “large” areas. The areas are then scanned across each color channel separately. Figure 48. Scan array for blemish The next stage of the test is the creation of a pixel map for each color channel with the coordinates of the failing pixels. See Figure 49. Figure 49. Fail map A pixel location is identified as a fail in the map if it satisfies the following criteria: Small_average < Large_average - (1.2% of Large_average) or Small_average > Large_average + (1.2% of Large_average) Blemish |
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