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DSP56857 데이터시트(PDF) 467 Page - Freescale Semiconductor, Inc

부품명 DSP56857
상세설명  Digitial Signal Controller
PDF  662 Pages
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제조업체  FREESCALE [Freescale Semiconductor, Inc]
홈페이지  http://www.freescale.com
Logo FREESCALE - Freescale Semiconductor, Inc

DSP56857 데이터시트(HTML) 467 Page - Freescale Semiconductor, Inc

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TAP Block Diagram
JTAG Port, Rev. 4
Freescale Semiconductor
17-5
17.4 TAP Block Diagram
Figure 17-1. Test Access Port (TAP) Block Diagram
Table 17-1. JTAG Pin Descriptions
Pin Name
Pin Description
TDI
Test Data Input—This input pin provides a serial input data stream to the JTAG and the EOnCE
modules. It is sampled on the rising edge of TCK and has an on-chip pull-up resistor.
TDO
Test Data Output—This tri-state output pin provides a serial output data stream from the JTAG
and the EOnCE modules. It is driven in the Shift-IR and Shift-DR controller states of the JTAG
state machine and changes on the falling edge of TCK.
TCK
Test Clock Input—This input pin provides the clock to synchronize the test logic and shift serial
data to and from all TAP Controllers and the TLM. If the EOnCE module is not being accessed
using the Master TAP Controllers, the maximum TCK frequency is 1/4 the maximum frequency for
the 56800E core. When accessing the EOnCE module through the 56800E core TAP Controller,
the maximum frequency for TCK is 1/8 the maximum frequency for the 56800E core.
The TCK pin has an on-chip pull-down resistor.
TMS
Test Mode Select Input—This input pin is used to sequence the JTAG TAP Controller’s state
machine. It is sampled on the rising edge of TCK and has an on-chip pull-up resistor.
TRST
Test Reset—This input provides a reset signal to the JTAG TAP Controller. The TRST pin has an
on-chip pull-up resistor.
DE
Debug Event—This output signal debugs events detected on a trigger condition.
Boundary Scan Register
Instruction Decode
TDI
TDO
TAP
TMS
TCK
TRST
IDCode Register
Bypass Register
Instruction Register
Controller



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