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56F8167 데이터시트(PDF) 163 Page - Freescale Semiconductor, Inc |
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56F8167 데이터시트(HTML) 163 Page - Freescale Semiconductor, Inc |
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163 / 184 page ![]() Analog-to-Digital Converter (ADC) Parameters 56F8367 Technical Data, Rev. 7.0 Freescale Semiconductor 163 Preliminary Figure 10-22 ADC Absolute Error Over Processing and Temperature Extremes Before and After Calibration for VDCin = 0.60V and 2.70V Note: The absolute error data shown in the graphs above reflects the effects of both gain error and offset error. The data was taken on 25 parts: three each from four processing corner lots as well as five from one nominally processed lot, each at three temperatures: -40°C, 27°C, and 150°C (giving the 75 data points shown above), for two input DC voltages: 0.60V and 2.70V. The data indicates that for the given population of parts, calibration significantly reduced (by as much as 24%) the collective variation (spread) of the absolute error of the population. It also significantly reduced (by as much as 38%) the mean (average) of the absolute error and thereby brought it significantly closer to the ideal value of zero. Although not guaranteed, it is believed that calibration will produce results similar to those shown above for any population of parts including those which represent processing and temperature extremes. |
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