| 전자부품 데이터시트 검색엔진 |
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VNF1048F 데이터시트(PDF) 18 Page - STMicroelectronics |
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VNF1048F 데이터시트(HTML) 18 Page - STMicroelectronics |
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18 / 52 page ![]() Figure 6. Current sense self test flow sequence 4.2 External FET VDS Detection Self Test The goal of the external FET VDS Detection Self Test is to verify the proper behavior of the complete VDS monitor chain (sense/process/detection), from the analog input to the digital output. Starting from the Unlocked State, the VDS Detection Self Test is activated through a dedicated SPI frame. The duration of this test is around 10 μs; the first 5 μs are intended to convert the value of the voltage across Drain and Source terminals of external FET, remaining 5 µs are required to bring back analog circuitry to normal configuration. Once the Self Test is started, an internal current generator provides a current sink able to produce an additional voltage offset of 100 mV on VDS monitor circuit inputs, to distinguish Self Test execution from normal operation. In order to guarantee proper data conversions, special care must be taken to avoid VDS ADC saturation by keeping the overall VDS sensed by monitor circuit below maximum scale range (1.87 V). VNF1048F External FET VDS Detection Self Test DS13084 - Rev 6 page 18/52 |
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