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TMS320DM647_0804 데이터시트(PDF) 56 Page - Texas Instruments |
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TMS320DM647_0804 데이터시트(HTML) 56 Page - Texas Instruments |
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56 / 182 page ![]() 6 Peripheral Information and Electrical Specifications 6.1 Parameter Information Transmission Line 4.0 pF 1.85 pF Z0 = 50 Ω (see Note) Tester Pin Electronics Data Sheet Timing Reference Point Output Under Test NOTE: The data sheet provides timing at the device pin. For output timing analysis, the tester pin electronics and its transmission line effects must be taken into account. A transmission line with a delay of 2 ns can be used to produce the desired transmission line effect. The transmission line is intended as a load only. It is not necessary to add or subtract the transmission line delay (2 ns) from the data sheet timings. Input requirements in this data sheet are tested with an input slew rate of < 4 Volts per nanosecond (4 V/ns) at the device pin. 42 Ω 3.5 nH Device Pin (see Note) 6.1.1 3.3-V Signal Transition Levels V ref Vref = VIL MAX (or VOL MAX) Vref = VIH MIN (or VOH MIN) 6.1.2 3.3-V Signal Transition Rates TMS320DM647/TMS320DM648 Digital Media Processor SPRS372B – MAY 2007 – REVISED APRIL 2008 www.ti.com Figure 6-1. Test Load Circuit for AC Timing Measurements The load capacitance value stated is only for characterization and measurement of ac timing signals. This load capacitance value does not indicate the maximum load the device is capable of driving. All input and output timing parameters are referenced to Vref for both 0 and 1 logic levels. For 3.3-V I/O, Vref = 1.5 V. For 1.8-V I/O, Vref = 0.9 V. Figure 6-2. Input and Output Voltage Reference Levels for ac Timing Measurements All rise and fall transition timing parameters are referenced to VIL MAX and VIH MIN for input clocks, VOLMAX and VOH MIN for output clocks. Figure 6-3. Rise and Fall Transition Time Voltage Reference Levels All timings are tested with an input edge rate of 4 volts per nanosecond (4 V/ns). Peripheral Information and Electrical Specifications 56 Submit Documentation Feedback |
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