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ADSP-BF504 데이터시트(PDF) 51 Page - Analog Devices

부품명 ADSP-BF504
상세설명  Blackfin Embedded Processor
PDF  80 Pages
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제조업체  AD [Analog Devices]
홈페이지  http://www.analog.com
Logo AD - Analog Devices

ADSP-BF504 데이터시트(HTML) 51 Page - Analog Devices

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Preliminary Technical Data
Rev. PrC
|
Page 51 of 80
|
January 2010
ADSP-BF504/F,ADSP-BF506F
Output Enable Time Measurement
Output pins are considered to be enabled when they have made
a transition from a high impedance state to the point when they
start driving.
The output enable time t
ENA is the interval from the point when a
reference signal reaches a high or low voltage level to the point
when the output starts driving as shown on the right side of
Figure 46.
The time t
ENA
_MEASURED is the interval, from when the reference sig-
nal switches, to when the output voltage reaches V
TRIP(high) or
V
TRIP(low). For V
DDEXT (nominal) = 1.8V, VTRIP (high) is 1.05V,
and VTRIP (low) is 0.75V. For VDDEXT (nominal) = 2.5V, VTRIP
(high) is 1.5V and VTRIP (low) is 1.0V. For VDDEXT (nominal) =
3.3V, VTRIP (high) is 1.9V, and VTRIP (low) is 1.4V. Time tTRIP is
the interval from when the output starts driving to when the
output reaches the V
TRIP(high) or VTRIP(low) trip voltage.
Time t
ENA is calculated as shown in the equation:
If multiple pins are enabled, the measurement value is that of
the first pin to start driving.
Output Disable Time Measurement
Output pins are considered to be disabled when they stop driv-
ing, go into a high impedance state, and start to decay from their
output high or low voltage. The output disable time t
DIS is the
difference between t
DIS
_MEASURED and tDECAY as shown on the left side
of Figure 46.
The time for the voltage on the bus to decay by
ΔV is dependent
on the capacitive load C
L and the load current IL. This decay time
can be approximated by the equation:
The time t
DECAY is calculated with test loads CL and IL, and with
ΔV equal to 0.25 V for V
DDEXT (nominal) = 2.5 V/3.3 V and 0.15 V
for VDDEXT (nominal) = 1.8V.
The time t
DIS
_MEASURED is the interval from when the reference sig-
nal switches, to when the output voltage decays
ΔV from the
measured output high or output low voltage.
Example System Hold Time Calculation
To determine the data output hold time in a particular system,
first calculate t
DECAY using the equation given above. Choose
ΔV
to be the difference between the processor’s output voltage and
the input threshold for the device requiring the hold time. C
L is
the total bus capacitance (per data line), and I
L is the total leak-
age or three-state current (per data line). The hold time will be
t
DECAY plus the various output disable times as specified in the
Processor — Timing Specifications on Page 31.
Capacitive Loading
Output delays and holds are based on standard capacitive loads
of an average of 6 pF on all pins (see Figure 47). VLOAD is equal
to (VDDEXT) /2. The graphs of Figure 48 through Figure 55 show
how output rise time varies with capacitance. The delay and
hold specifications given should be derated by a factor derived
from these figures. The graphs in these figures may not be linear
outside the ranges shown.
Figure 46. Output Enable/Disable
REFERENCE
SIGNAL
tDIS
OUTPUT STARTS DRIVING
VOH (MEASURED)
V
VOL (MEASURED) + V
tDIS_MEASURED
VOH
(MEASURED)
VOL
(MEASURED)
VTRIP(HIGH)
VOH(MEASURED)
VOL(MEASURED)
HIGH IMPEDANCE STATE
OUTPUT STOPS DRIVING
tENA
tDECAY
tENA_MEASURED
tTRIP
VTRIP(LOW)
tENA
tENA_MEASURED tTRIP
–
=
tDIS
tDIS_MEASURED tDECAY
–
=
tDECAY
CL V
Δ
() I
L
⁄
=
Figure 47. Equivalent Device Loading for AC Measurements
(Includes All Fixtures)
Figure 48. Typical Rise and Fall Times (10%–90%) versus Load Capacitance
for Driver A at VDDEXT = Min
T1
ZO = 50
(impedance)
TD = 4.04
1.18 ns
2pF
TESTER PIN ELECTRONICS
50
0.5pF
70
400
45
4pF
NOTES:
THE WORST CASE TRANSMISSION LINE DELAY IS SHOWN AND CAN BE USED
FOR THE OUTPUT TIMING ANALYSIS TO REFELECT THE TRANSMISSION LINE
EFFECT AND MUST BE CONSIDERED. THE TRANSMISSION LINE (TD), IS FOR
LOAD ONLY AND DOES NOT AFFECT THE DATA SHEET TIMING SPECIFICATIONS.
ANALOG DEVICES RECOMMENDS USING THE IBIS MODEL TIMING FOR A GIVEN
SYSTEM REQUIREMENT. IF NECESSARY, A SYSTEM MAY INCORPORATE
EXTERNAL DRIVERS TO COMPENSATE FOR ANY TIMING DIFFERENCES.
VLOAD
DUT
OUTPUT
50
DA
TA
TB
D



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