ADG5401 datasheet(3/17 Pages) AD

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Data Sheet

ADG5401

SPECIFICATIONS

±15 V DUAL SUPPLY

VDD = +15 V ± 10%, VSS = −15 V ± 10%, GND = 0 V, unless otherwise noted.

Table 1.

Parameter

25°C

−40°C to +85°C

−40°C to +125°C

Unit

Test Conditions/Comments

ANALOG SWITCH

Analog Signal Range

VDD to VSS

On Resistance, RON

6.5

Ω typ

VS = ±10 V, IS = −10 mA; see Figure 21

Ω max

VDD = +13.5 V, VSS = −13.5 V

On-Resistance Flatness, RFLAT (ON)

Ω typ

VS = ±10 V, IS = −10 mA

1.4

1.7

Ω max

LEAKAGE CURRENTS

VDD = +16.5 V, VSS = −16.5 V

Source Off Leakage, IS (Off)

±0.1

nA typ

VS = ±10 V, VD =  10 V; see Figure 20

±0.5

±2

±20

nA max

Drain Off Leakage, ID (Off)

±0.1

nA typ

VS = ±10 V, VD =  10 V; see Figure 20

±0.5

±2

±20

nA max

Channel On Leakage, ID (On), IS (On)

±0.2

nA typ

VS = VD = ±10 V; see Figure 23

±1

±8

±40

nA max

DIGITAL INPUTS

Input High Voltage, VINH

2.0

V min

Input Low Voltage, VINL

0.8

V max

Input Current, IINL or IINH

0.002

µA typ

VIN = VGND or VDD

±0.1

µA max

Digital Input Capacitance, CIN

pF typ

DYNAMIC CHARACTERISTICS1

tON

160

ns typ

RL = 300 Ω, CL = 35 pF

193

230

253

ns max

VS = 10 V; see Figure 26

tOFF

175

ns typ

RL = 300 Ω, CL = 35 pF

207

230

242

ns max

VS = 10 V; see Figure 26

Charge Injection, QINJ

220

pC typ

VS = 0 V, RS = 0 Ω, CL = 1 nF; see

Figure 27

Off Isolation

−50

dB typ

RL = 50 Ω, CL = 5 pF, f = 1 MHz; see

Figure 22

Total Harmonic Distortion + Noise

(THD + N)

0.01

% typ

RL = 1 kΩ, 15 V p-p, f = 20 Hz to

20 kHz; see Figure 24

−3 dB Bandwidth

170

MHz typ

RL = 50 Ω, CL = 5 pF; see Figure 25

Insertion Loss

−0.4

dB typ

RL = 50 Ω, CL = 5 pF, f = 1 MHz;

see Figure 25

CS (Off)

pF typ

VS = 0 V, f = 1 MHz

CD (Off)

pF typ

VS = 0 V, f = 1 MHz

CD (On), CS (On)

pF typ

VS = 0 V, f = 1 MHz

POWER REQUIREMENTS

VDD = +16.5 V, VSS = −16.5 V

IDD

µA typ

Digital inputs = 0 V or VDD

µA max

ISS

0.001

µA typ

Digital inputs = 0 V or VDD

µA max

VDD/VSS

±9/±22

V min/V max

GND = 0 V

Guaranteed by design; not subject to production test.

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