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전자부품 데이터시트 검색엔진 |
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전자부품 데이터시트 검색엔진 |
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STGAP1S 데이터시트(PDF) 38 Page - STMicroelectronics |
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STGAP1S 데이터시트(HTML) 38 Page - STMicroelectronics |
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38 / 67 page  Functional description STGAP1S 38/67 DocID027190 Rev 3 To ensure the check result, some applicative conditions have to be verified: – The bleeding resistor, sometimes present between the gate and source in the power switch, shall be lower than 8.2 k . – During the test, the power switch gate shall have the time to be charged up to VCLAMPth by IGOFFchk. In case no bleeding resistor is present, this time can be roughly computed as: tGATE_GOFFchk ≈ CGATE * (VCLAMPth - VL) / IGOFFchk If a bleeding resistor is present or an additional push-pull circuit has been added, the time has to be computed with the adequate corrective factors. If the check fails due to the lack of the GOFF resistor, the power switch gate will gradually rise up to VH with no protections of SENSE nor DESAT. The user test routine shall consider this behavior. Figure 17. Gate paths check circuitry Floating Section Control Logic Floating ground VH GON GOFF VL CLAMP GNDISO VCLAMPth + Level Shifter SD SDO CK CS SDI SPI Control Logic I S O L A T I O N IGOFFchk VH testcontrol |
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