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HCS12 데이터시트(PDF) 65 Page - Freescale Semiconductor, Inc |
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HCS12 데이터시트(HTML) 65 Page - Freescale Semiconductor, Inc |
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65 / 452 page ![]() S12CPUV2 Reference Manual, Rev. 4.0 Freescale Semiconductor 65 5.13 Bit Test and Manipulation Instructions The bit test and manipulation operations use a mask value to test or change the value of individual bits in an accumulator or in memory. Bit test A (BITA) and bit test B (BITB) provide a convenient means of testing bits without altering the value of either operand. Table 5-11 is a summary of bit test and manipulation instructions. Table 5-11. Bit Test and Manipulation Instructions Mnemonic Function Operation BCLR Clear bits in memory (M) • (mm) ⇒ M BITA Bit test A (A) • (M) BITB Bit test B (B) • (M) BSET Set bits in memory (M) + (mm) ⇒ M |
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