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STM32F102X8 데이터시트(PDF) 51 Page - STMicroelectronics |
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STM32F102X8 데이터시트(HTML) 51 Page - STMicroelectronics |
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51 / 80 page ![]() DocID15056 Rev 5 51/80 STM32F102x8, STM32F102xB Electrical characteristics 79 5.3.12 I/O current injection characteristics As a general rule, current injection to the I/O pins, due to external voltage below VSS or above VDD (for standard, 3 V-capable I/O pins) should be avoided during normal product operation. However, in order to give an indication of the robustness of the microcontroller in cases when abnormal injection accidentally happens, susceptibility tests are performed on a sample basis during device characterization. Functional susceptibilty to I/O current injection While a simple application is executed on the device, the device is stressed by injecting current into the I/O pins programmed in floating input mode. While current is injected into the I/O pin, one at a time, the device is checked for functional failures. The failure is indicated by an out of range parameter: ADC error above a certain limit (>5 LSB TUE), out of spec current injection on adjacent pins or other functional failure (for example reset, oscillator frequency deviation). The test results are given in Table 35. 5.3.13 I/O port characteristics General input/output characteristics Unless otherwise specified, the parameters given in Table 36 are derived from tests performed under the conditions summarized in Table 8. All I/Os are CMOS and TTL compliant. General input/output characteristics Unless otherwise specified, the parameters given in Table 34 are derived from tests performed under the conditions summarized in Table 8. All I/Os are CMOS and TTL compliant. Table 33. I/O current injection susceptibility Symbol Description Functional susceptibility Unit Negative injection Positive injection IINJ Injected current on OSC_IN32, OSC_OUT32, PA4, PA5, PC13 -0 +0 mA Injected current on all FT pins -5 +0 Injected current on any other pin -5 +5 |
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