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ST10F296 데이터시트(PDF) 311 Page - STMicroelectronics |
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ST10F296 데이터시트(HTML) 311 Page - STMicroelectronics |
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311 / 346 page ![]() Obsolete Product(s) - Obsolete Product(s) ST10F296E Electrical characteristics 311/346 Equation 38 Equation 36, and Equation 38 define respectively the three elements of an external circuit, RF, CF, and RL. Next, some conditions which are used to size the circuit must be verified. The first of these is a calculation which allows the accuracy error, introduced by the switched capacitance equivalent resistance, to be minimized. This is given in Equation 39. Equation 39 The error due to the voltage partitioning between the real resistive path and CS is less then half a count if considering the worst case when VA = 5 V (see Equation 40). Equation 40 The other conditions to verify are if the time constants of the transients are shorter than the sampling period duration, TS, and whether the distance is significant. These calculations are given in Equation 41 and Equation 42. Equation 41 Equation 42 For a complete set of parameter characterization of the ST10F296E ADC equivalent circuit, refer to Table 166: ADC characteristics on page 302. 24.8 AC characteristics 24.8.1 Test waveforms Figure 102. Input/output waveforms 1. AC inputs during testing are driven at 2.4 V for a logic 1 and at 0.4 V for a logic 0. 2. Timing measurements are made at VIH min. for a logic 1 and VIL max for a logic 0. R L V AM I INJ ⁄ () R F – R S 2.9k Ω = – = R EQ 1f CCS ⁄ 10M Ω == V A R S R F R L R SW R AD ++ + + () R EQ ⁄ × 2.35mV 1 2 ⁄ ()LSB < = τ 1 R SW R AD + () C S × 2.8ns T S 1 µs = « == 10 τ 2 × 10 R L × C S C P1 C P2 ++ () × 290ns T S 1 µs = < == 2.4 V 0.4 V Test points 2.0 V 2.0 V 0.8 V 0.8 V Obsolete Product(s) - Obsolete Product(s) |
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