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VSC8221 데이터시트(PDF) 46 Page - Microsemi Corporation |
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VSC8221 데이터시트(HTML) 46 Page - Microsemi Corporation |
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46 / 138 page ![]() VSC8221 Data Sheet VMDS-10106 Revision 4.1 December 2006 46 of 46 46 BYPASS The Bypass Register contains a single shift-register stage and is used to provide a minimum-length serial path (one TCK clock period) between TDi and TDO to bypass the device when no test operation is required. 14.2 Boundary-Scan Register Cell Order All inputs and outputs are observed in the Boundary-Scan Register cells. All outputs are additionally driven by the contents of Boundary-Scan Register cells. Bidirectional pins have all three related Boundary-Scan Register cells: the input, the output, and the control. The full boundary scan cell order is available from Microsemi Semiconductor in *.BSD file format. |
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