| 전자부품 데이터시트 검색엔진 |
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L9961 데이터시트(PDF) 20 Page - STMicroelectronics |
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L9961 데이터시트(HTML) 20 Page - STMicroelectronics |
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20 / 63 page ![]() Fault type Assertion condition IC reaction to assertion Release condition IC reaction to flag clear Maskable VB vs. sum of cells plausibility fail If the absolute value of the difference between VB_MEAS and VCELL_SUM is greater than VB_VSUM_MAX_DIF F_TH, the plausibility check fail is acknowledged FAULTN line is asserted If the absolute value of the difference between VB_MEAS and VCELL_SUM falls below the VB_VSUM_MAX_DIF F_TH, the VB_SUM_CHECK_F AIL flag can be cleared by MCU FAULTN line is released VB_SUM_CHECK_F AULTN_MSK masks reaction on FAULTN pin 3.4.2.1 Electrical parameters All parameters are tested and guaranteed in the following conditions, unless otherwise noted: VB according operating range of Table 4; TJ according operating range of Table 7. Table 13. Battery stack monitor external parameters Symbol Parameter Test conditions Min. Typ. Max. Unit VB_RANGE VB voltage input measurement range Design info 4.3 25 V VB_RES VB voltage measurement resolution Design info 6.1 (25 V/212) mV NBIT ADC bit number Design info 12 bit VBERR_1 VB voltage measurement total 4.3 V<VB<7.5 V -40 °C< TJ<105 °C -150 150 mV VBERR_2 VB voltage measurement total 7.5 V<VB<22.5 V -40 °C< TJ<105 °C -100 100 mV VBERR_3 VB voltage measurement total 22.5 V<VB<25 V -40 °C< TJ<105 °C -150 150 mV VB_OV_TH Programmable VB OV fault threshold (8 bit) VBOVTH=16VB_RES*CODE TestedbySCAN 0 25 V NVB_OV_CNT_TH Programmable VB OV event counter threshold (4 bit) Tested by SCAN 1 15 events VB_UV_TH Programmable VB UV fault threshold (8 bit) VBUVTH=16VB_RES*CODE TestedbySCAN 0 25 V NVB_UV_CNT_TH Programmable VB UV event counter threshold (4 bit) Tested by SCAN 1 15 events VB_SUM_MAX_DIFF_TH Programmable plausibility check threshold between VB and sum of cells (8 bit) Tested by SCAN 0 25 V 3.4.3 Cell temperature monitor (NTC) The NTC cell temperature monitoring voltage conversion routine monitors pack temperature by sensing the NTC pin. This function is enabled by programming the NTC_EN bit: if disabled, no conversion occurs. When NTC_EN = 1, the OD open-drain is switched ON at the beginning of the voltage conversion routine, prior to the cells step execution. This allows voltage on the NTC pin to settle before NTC acquisition is performed. Once the NTC is completed, the OD open-drain switch is released, reducing overall current consumption from VREG. L9961 Voltage conversion routine DS14012 - Rev 1 page 20/63 |
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