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L9961 데이터시트(PDF) 23 Page - STMicroelectronics

부품명 L9961
상세설명  Battery management system solution
PDF  63 Pages
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제조업체  STMICROELECTRONICS [STMicroelectronics]
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L9961 데이터시트(HTML) 23 Page - STMicroelectronics

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Fault type
Assertion condition
IC reaction to
assertion
Release condition
IC reaction to flag
clear
Maskable
DIE OT
If Die temperature
raises above TOT_TH,
the DIE_OT fault is
acknowledged
Both charge and
discharge FETs are
turned OFF
If Die temperature
falls below TOT_TH
TOT_HYST, the DIE_OT
flag can be cleared by
MCU upon read
The discharge FET
is restored to the
status defined by the
DCHG_ON bit
DIE_OT_BAL_MSK
masks reaction on
balancing
Balancing is interrupted
on all cells
Balancing FETs are
restored to the
status defined by
the corresponding
BAL<x>_ON bit
DIE_OT_FAULTN_MS
K masks reaction on
FAULTN pin
FAULTN line is
asserted
FAULTN line is
released
3.4.4.1
Electrical parameters
All parameters are tested and guaranteed in the following conditions, unless otherwise noted:
VB according operating range of Table 4; TJ according operating range of Table 7.
Table 17. Die temperature monitor electrical parameters
Symbol
Parameter
Min.
Typ.
Max.
Unit
Tj_ERR
Die temperature total conversion error
-10
-
10
°C
TOT_TH
Overtemperature threshold
150
-
°C
TOT_HYST
Overtemperature threshold hysteresis
5
-
15
°C
3.4.5
Diagnostics principle
The following example on Cell UV detection applies to all diagnostics featuring a programmable event counter.
The counter implements a symmetric hysteresis:
Each fault is asserted if the corresponding threshold is overcome. In such a case L9961 puts in place the
programmed reactions, based on the masking bits
Fault counter is saturated to the programmed threshold as long as fault is still present. During such an
interval, any attempt to clear the fault status is discarded. To avoid inadvertent fault detection, fault counter
threshold is saturated to 1 on the lower bound, meaning that at least one fault event must occur for fault
detection. Writing a ‘0’ to any I2C fault counter threshold will result in internal threshold being clamped to ‘1’
When fault is removed and event counter reaches zero, the fault flag can be cleared on write by MCU. In
such a case, system is brought back to functional state.
L9961
Voltage conversion routine
DS14012 - Rev 1
page 23/63



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