| 전자부품 데이터시트 검색엔진 |
|
DSP56600FM/AD 데이터시트(PDF) 42 Page - NXP Semiconductors |
|
|
|||||||||||||||||||||||||||||
DSP56600FM/AD 데이터시트(HTML) 42 Page - NXP Semiconductors |
|
42 / 76 page ![]() Preliminary 1-36 DSP56651 Technical Data Sheet MOTOROLA Pin and Signal Descriptions DSP56651 Signal Description JTAG Port When the bottom connector pins are selected as a debug port by holding the MUX_CTL pin at a logic high, the dedicated JTAG pins become inactive. That is, they are disconnected from the JTAG TAP controller. For JTAG signals equipped with resistors, all pull-ups and pull-downs are automatically disconnected when the pin is an output. Table 1-22 JTAG Port Signals Signal Name Signal Type State during Reset Signal Description TMS Input Input Test mode select —TMS is an input signal used to sequence the test controller’s state machine. TMS is sampled on the rising edge of TCK and has an internal 47 k Ω pull-up resistor. MUX_CTL high : INT7 is connected to the JTAG TAP controller and functions as TMS, see Table 1-12 on page 1-19.) TDI Input Input Test data input —TDI is a serial test data input signal used for test instructions and data. TDI is sampled on the rising edge of TCK and has an internal 47 k Ω pull-up resistor. MUX_CTL high : RxD is connected to the JTAG TAP controller and functions as TDI, see Table 1-15 on page 1-26.) TDO Output Tri- stated Test data output —TDO is a test data serial output signal used for test instructions and data. TDO is tri-statable and is actively driven in the shift-IR and shift-DR controller states. TDO changes on the falling edge of TCK. MUX_CTL high : TxD is connected to the JTAG TAP controller and functions as TDO, see Table 1-15 on page 1-26.) TCK Input Input Test clock —TCK is a test clock input signal used to synchronize the JTAG test logic. It has an internal 47 k Ω pull-up resistor. MUX_CTL high : ROW7 is connected to the JTAG TAP controller and functions as TCK, see Table 1-14 on page 1-22.) TRST Input Input Test reset —TRST is an active-low Schmitt-trigger input signal used to asynchronously initialize the test controller. TRST has an internal 47 k Ω pull-up resistor. MUX_CTL high : INT6 is connected to the JTAG TAP controller and functions as TRST, see Table 1-12 on page 1-19.) TEST Input Input Factory test mode —Selects factory test mode. Reserved. This pin MUST be connected to ground. Freescale Semiconductor, Inc. For More Information On This Product, Go to: www.freescale.com |
|
링크 URL |
| ALLDATASHEET 가 귀하에 도움이 되셨나요? [ DONATE ] |
Alldatasheet는? | 광고문의 | 운영자에게 연락하기 | 개인정보취급방침 | 링크 투 데이터시트 | 링크교환 | 제조사별 검색 All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |