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전자부품 데이터시트 검색엔진 |
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전자부품 데이터시트 검색엔진 |
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MCF5373CAB180 데이터시트(PDF) 38 Page - Freescale Semiconductor, Inc |
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MCF5373CAB180 데이터시트(HTML) 38 Page - Freescale Semiconductor, Inc |
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38 / 42 page  MCF5373 ColdFire® Microprocessor Data Sheet, Rev. 0.3 Preliminary Preliminary Electrical Characteristics Freescale Semiconductor 38 Figure 27. Test Clock Input Timing Figure 28. Boundary Scan (JTAG) Timing J11 TCLK Low to TDO Data Valid tTDODV 026 ns J12 TCLK Low to TDO High Z tTDODZ 08 ns J13 TRST Assert Time tTRSTAT 100 — ns J14 TRST Setup Time (Negation) to TCLK High tTRSTST 10 — ns NOTES: 1 JTAG_EN is expected to be a static signal. Hence, specific timing is not associated with it. Table 24. JTAG and Boundary Scan Timing (continued) Num Characteristics1 Symbol Min Max Unit TCLK VIL VIH J4 J4 (input) J2 J3 J3 Input Data Valid Output Data Valid Output Data Valid TCLK Data Inputs Data Outputs Data Outputs Data Outputs VIL VIH J7 J8 J7 J6 J5 |
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