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전자부품 데이터시트 검색엔진 |
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전자부품 데이터시트 검색엔진 |
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HCS12 데이터시트(PDF) 299 Page - Freescale Semiconductor, Inc |
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HCS12 데이터시트(HTML) 299 Page - Freescale Semiconductor, Inc |
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299 / 452 page  Glossary S12CPUV2 Reference Manual, Rev. 4.0 Freescale Semiconductor 299 Operation: (M) – $00 Description: Subtracts $00 from the content of memory location M and sets the condition codes accordingly. The subtraction is accomplished internally without modifying M. The TST instruction provides limited information when testing unsigned values. Since no unsigned value is less than zero, BLO and BLS have no utility following TST. While BHI can be used after TST, it performs the same function as BNE, which is preferred. After testing signed values, all signed branches are available. TST Test Memory TST CCR Details: S X HIN Z V C –––– ∆∆ 00 N: Set if MSB of result is set; cleared otherwise Z: Set if result is $00; cleared otherwise V: 0; cleared C: 0; cleared Source Form Address Mode Object Code Access Detail HCS12 M68HC12 TST opr16a TST oprx0_xysp TST oprx9,xysp TST oprx16,xysp TST [D,xysp] TST [oprx16,xysp] EXT IDX IDX1 IDX2 [D,IDX] [IDX2] F7 hh ll E7 xb E7 xb ff E7 xb ee ff E7 xb E7 xb ee ff rPO rPf rPO frPP fIfrPf fIPrPf rOP rfP rPO frPP fIfrfP fIPrfP |
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