TNETX3100PGC datasheet(47/80 Pages) TI1

47 / 80 page

TNETX3100

ThunderSWITCH™ 10-PORT 10-/100-MBIT/S ETHERNET™ SWITCH

SPWS031D – JUNE 1997 – REVISED OCTOBER 1997

POST OFFICE BOX 655303

• DALLAS, TEXAS 75265

supported JTAG instructions (continued)

Table 8. Opcodes for JTAG Instructions

INSTRUCTION TYPE

INSTRUCTION NAME

JTAG

OPCODE

Mandatory

EXTEST

000000

Mandatory

SAMPLE/PRELOAD

000001

Optional

IDCODE

000100

Optional

HIGHZ

000101

Mandatory

BYPASS

111111

The IDCODE for the TNETX3100 is given in Table 9.

Table 9. IDCODE Code

VARIANT

PART NUMBER

MANUFACTURE

LEAST-SIGNIFICANT BIT

Bit 31

Bit 28 Bit 27

Bit 12 Bit 11

Bit 1

Bit 0

0000

0000000001000110

00000010111

manufacturing test features

The methodology of these tests is considered before implementation. All tests are based on an incremental

approach; for tests using the DIO interface (for example), only the DIO interface should be tested and if it is

functioning correctly, the next depth of testing is performed (i.e., internal TNETX3100 testing). If a test fails using

this methodology, the cause of the failure can be determined quickly and test/debug time is reduced.

primary test access: DIO testing

The DIO registers can be written to and read directly from the terminal interface. This level of testing is trivial,

but essential before continuing to test the TNETX3100 internally.

secondary test access: internal RAM access modes

When implementing an architecture that employs embedded RAM structures, it is necessary to ensure test

access greater than JTAG-connectivity testing through standard interfacing. The DIO interface used by

TNETX3100 enables the user to interrogate the internal RAMS of the TNETX3100. User interrogation gives the

required observability for the RAMs and the data they contain.

RAM test access is desirable at all levels of testing:

• Silicon production level that enables detection of defective devices

• System production level that permits diagnostic testing

• Field-level that allows diagnostics and debugging

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