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AD8335 데이터시트(PDF) 15 Page - Analog Devices |
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AD8335 데이터시트(HTML) 15 Page - Analog Devices |
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15 / 24 page ![]() AD8335 Rev. 0 | Page 15 of 24 TEST CIRCUITS 28 Ω 237 Ω 249 Ω 1:1 NETWORK ANALYZER AD8335 18nF 22pF 50 Ω IN OUT 0.1 µF 237 Ω 28 Ω 0.1 µF 0.1 µF 50 Ω 49.9 Ω 0.1 µF Figure 49. Test Circuit for Gain and Bandwidth Measurements 1:1 AD8335 22pF 0.1 µF 0.1 µF 0.1 µF 49 Ω 0.1 µF IN 50 Ω SPECTRUM ANALYZER Figure 50. Test Circuit Used for Noise Measurements 28 Ω 237 Ω 249 Ω 1:1 AD8335 18nF 22pF 0.1 µF 237 Ω 28 Ω 0.1 µF 0.1 µF 49.9 Ω 0.1 µF 50 Ω IN 50 Ω OSCILLOSCOPE Figure 51. Test Circuit for Transient Measurements 28 Ω 237 Ω 249 Ω 1:1 NETWORK ANALYZER AD8335 18nF 22pF 50 Ω IN OUT 0.1 µF 237 Ω 28 Ω 0.1 µF 0.1 µF 50 Ω 49.9 Ω 0.1 µF 50 Ω 50 Ω Figure 52. Test Circuit Used for S11 Measurements 28 Ω 237 Ω 249 Ω 1:1 AD8335 18nF 22pF 0.1 µF 237 Ω 28 Ω 0.1 µF 0.1 µF 50 Ω 0.1 µF 50 Ω IN 50 Ω SPECTRUM ANALYZER LPF SIGNAL GENERATOR Figure 53. Test Circuit Used for Distortion Measurements |
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