| 전자부품 데이터시트 검색엔진 |
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TBD 데이터시트(PDF) 62 Page - Freescale Semiconductor, Inc |
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TBD 데이터시트(HTML) 62 Page - Freescale Semiconductor, Inc |
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62 / 80 page ![]() MSC8144E Quad Core Digital Signal Processor Data Sheet, Rev. 6 Freescale Semiconductor 62 2.7.14 JTAG Signals Figure 39 Shows the Test Clock Input Timing Diagram Figure 40 Shows the boundary scan (JTAG) timing diagram. Table 55. JTAG Timing Characteristics Symbol All frequencies Unit Min Max TCK cycle time tTCKX 36.0 — ns TCK clock high phase measured at VM = 1.6 V tTCKH 15.0 — ns TCK rise and fall times tTCKR —3.0 ns Boundary scan input data set-up time tBSVKH 0.0 — ns Boundary scan input data hold time tBSXKH 15.0 — ns TCK fall to output data valid tTCKHOV — 20.0 ns TCK fall to output high impedance tTCKHOZ — 24.0 ns TMS, TDI data set-up time tTDIVKH 0.0 — ns TMS, TDI data hold time tTDIXKH 5.0 — ns TCK fall to TDO data valid tTDOHOV — 10.0 ns TCK fall to TDO high impedance tTDOHOZ — 12.0 ns TRST assert time tTRST 100.0 — ns Note: All timings apply to OnCE module data transfers as well as any other transfers via the JTAG port. Figure 39. Test Clock Input Timing Figure 40. Boundary Scan (JTAG) Timing TCK (Input) VM VM tTCKX tTCKH tTCKR tTCKR TCK (Input) Data Inputs Data Outputs Data Outputs Input Data Valid Output Data Valid tBSXKH tBSVKH tTCKHOV tTCKHOZ |
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