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PCIMX515CJM6C 데이터시트(PDF) 59 Page - Freescale Semiconductor, Inc |
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PCIMX515CJM6C 데이터시트(HTML) 59 Page - Freescale Semiconductor, Inc |
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59 / 184 page ![]() Electrical Characteristics i.MX51 Applications Processors for Consumer and Industrial Products, Rev. 1 Freescale Semiconductor 59 Preliminary—Subject to Change Without Notice Table 48. Derating values for DDR2 Differential DQS1,2 Table 49. Derating values for DDR2 Single Ended DQS3,4 1. Test conditions are: Capacitance 15 pF for DDR PADS. Recommended drive strengths is medium for SDCLK and high for address and controls. 2. SDRAM CLK and DQS related parameters are being measured from the 50% point. that is, high is defined as 50% of signal value and low is defined as 50% as signal value. DDR SDRAM CLK parameters are measured at the crossing point of SDCLK and SDCLK (inverted clock). 3. Test conditions are: Capacitance 15 pF for DDR PADS. Recommended drive strengths is medium for SDCLK and high for address and controls. 4. SDRAM CLK and DQS related parameters are being measured from the 50% point. that is, high is defined as 50% of signal value and low is defined as 50% as signal value. DDR SDRAM CLK parameters are measured at the crossing point of SDCLK and SDCLK (inverted clock). |
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