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MPC8569E 데이터시트(PDF) 94 Page - Freescale Semiconductor, Inc |
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MPC8569E 데이터시트(HTML) 94 Page - Freescale Semiconductor, Inc |
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94 / 127 page ![]() MPC8569E PowerQUICC III Integrated Processor Hardware Specifications, Rev. 1 Serial RapidIO (SRIO) Freescale Semiconductor 94 2.11.4.2 AC Requirements for Serial RapidIO Transmitter The following table defines the transmitter AC specifications for the Serial RapidIO. The AC timing specifications do not include RefClk jitter The following table defines the receiver AC specifications for Serial RapidIO. The AC timing specifications do not include RefClk jitter. Table 55. SRIO Transmitter AC Timing Specifications At recommended operating conditions with XVDD = 1.0 V ± 3%. and 1.1 V ± 3% Parameter Symbol Min Typical Max Unit Notes Deterministic jitter JD — — 0.17 UI p-p — Total jitter JT — — 0.35 UI p-p — Unit Interval: 1.25 GBaud UI 800 – 100ppm 800 800 + 100ppm ps — Unit Interval: 2.5 GBaud UI 400 – 100ppm 400 400 + 100ppm ps — Unit Interval: 3.125 GBaud UI 320 – 100ppm 320 320 + 100ppm ps — Table 56. SRIO Receiver AC Timing Specifications At recommended operating conditions with ScoreVDD = 1.0 V ± 3%. and 1.1 V ± 3%. Parameter Symbol Min Typical Max Unit Notes Deterministic jitter tolerance JD 0.37 — — UI p-p 1, 3 Combined deterministic and random jitter tolerance JDR 0.55 — — UI p-p 1, 3 Total jitter tolerance2 JT 0.65 — — UI p-p 1, 3 Bit error rate BER — — 10–12 —— Unit Interval: 1.25 GBaud UI 800 – 100ppm 800 800 + 100ppm ps — Unit Interval: 2.5 GBaud UI 400 – 100ppm 400 400 + 100ppm ps — Unit Interval: 3.125 GBaud UI 320 – 100ppm 320 320 + 100ppm ps — Notes: 1. Measured at receiver 2. Total jitter is composed of three components: deterministic jitter, random jitter and single frequency sinusoidal jitter. The sinusoidal jitter may have any amplitude and frequency in the unshaded region of Figure 48. The sinusoidal jitter component is included to ensure margin for low-frequency jitter, wander, noise, crosstalk, and other variable system effects. 3. System/board must be designed to ensure the input requirement to the device is achieved. Proper device operation is guaranteed for inputs meeting this requirement by design, simulation, characterization, or functional testing |
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