AT697F datasheet(70/155 Pages) ATMEL

70 / 155 page

7703C–AERO–6/09

AT697F ADVANCE INFORMATION

It is used to test connections between components at board level. Components output pins are

controlled by boundary scan register during Capture DR on the rising edge of TCK.

SAMPLE/PRELOAD

This instruction is binary coded "001"

It is used to get a snapshot of the normal operation by sampling I/O states during Capture DR on

the rising edge of TCK. It allows also to preload a value on the output latches during Update DR

on falling edge of TCK. It do not modify system behaviour.

IDCODE

This instruction is binary coded "111"

Value of the IDCODE is loaded during Capture DR.

Test Data

Registers

The following data registers are supported in the AT697 TAP:

Bypass Register

Bypass register containing a single shift register stage is connected between TDI and TDO.

Figure 45. Bypass Register Cell

from TDI

to TDO

Clock DR

Shift DR

Device ID register

Device ID register is a read only 32-bit register.

It is connected between TDI and TDO.

Figure 46. Device ID Register

Vers.

Part ID

Manufacturer’s ID

Const.

0001

1011 . 0110 . 0100 . 0101

000 . 0101 . 1000

ID. register value: 0x 1b64 50b1

Field Definitions:

[31:28]: Vers - Version number - 0x1

[27:12]: Part ID - Represent part number as assigned by Vendor- 0x b645

[11:01]: Manufacturer’s ID - Represent manufacturer’s ID as per JEDEC - 0x 058

[0]: Const - Constant tied to logic ’1’.

AT697F 데이터시트(PDF) 70 Page - ATMEL Corporation