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AFE4490 데이터시트(PDF) 2 Page - Texas Instruments

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부품명 AFE4490
상세설명  Integrated Analog Front-End for Heart Rate Monitors and Low-Cost Pulse Oximeters
PDF  69 Pages
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제조업체  TI [Texas Instruments]
홈페이지  http://www.ti.com
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AFE4490 데이터시트(HTML) 2 Page - Texas Instruments

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AFE4400
SBAS601D – DECEMBER 2012 – REVISED MAY 2013
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
FAMILY AND ORDERING INFORMATION
LED DRIVE
OPERATING
LED DRIVE
CURRENT
POWER SUPPLY
TEMPERATURE
PRODUCT
PACKAGE-LEAD
CONFIGURATION
(mA, max)
(V)
RANGE
AFE4400
QFN-40
Bridge, push-pull
50
3 to 3.6
0°C to +70°C
50, 75, 100,
AFE4490
QFN-40
Bridge, push-pull
3 to 5.25
–40°C to +85°C
150, and 200
ABSOLUTE MAXIMUM RATINGS
(1)
Over operating free-air temperature range, unless otherwise noted.
VALUE
UNIT
AVDD to AVSS
–0.3 to +7
V
DVDD to DGND
–0.3 to +7
V
AGND to DGND
–0.3 to +0.3
V
Analog input to AVSS
AVSS – 0.3 to AVDD + 0.3
V
Digital input to DVDD
DVSS – 0.3 to DVDD + 0.3
V
Input current to any pin except supply pins(2)
±7
mA
Momentary
±50
mA
Input current
Continuous
±7
mA
Operating temperature range
0 to +70
°C
Storage temperature range, Tstg
–60 to +150
°C
Maximum junction temperature, TJ
+125
°C
Human body model (HBM)
±4000
V
JEDEC standard 22, test method A114-C.01, all pins
Electrostatic discharge
(ESD) ratings
Charged device model (CDM)
±1500
V
JEDEC standard 22, test method C101, all pins
(1)
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2)
Input terminals are diode-clamped to the power-supply rails. Input signals that can swing beyond the supply rails must be current-limited
to 10 mA or less.
THERMAL INFORMATION
AFE4400
THERMAL METRIC(1)
RHA (QFN)
UNITS
40 PINS
θJA
Junction-to-ambient thermal resistance
35
θJCtop
Junction-to-case (top) thermal resistance
31
θJB
Junction-to-board thermal resistance
26
°C/W
ψJT
Junction-to-top characterization parameter
0.1
ψJB
Junction-to-board characterization parameter
n/a
θJCbot
Junction-to-case (bottom) thermal resistance
n/a
(1)
For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.
2
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Copyright © 2012–2013, Texas Instruments Incorporated
Product Folder Links: AFE4400



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